Beilstein J. Nanotechnol.2022,13, 1120–1140, doi:10.3762/bjnano.13.95
, but also perform rapid overview scans with the tip kept at larger tip–sample distances for robust imaging.
Keywords: atomic force microscopy; atomic resolution; instrumentationdesign; multimodal operation; ultrahigh vacuum; Introduction
Atomic force microscopy (AFM) operated under vacuum or
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Figure 1:
CAD drawings of the top and side views of the UHV system consisting of a cryostat chamber, a prepar...
Beilstein J. Nanotechnol.2017,8, 358–371, doi:10.3762/bjnano.8.38
to optimally actuate and sense M1–M4 respectively. Metal traces forming electrical connections run down the center of the cantilever. This splits some piezoelectric layers in two and these split layers are wire-bonded back together.
Instrumentation of the cantilever
Instrumentationdesign
The
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Figure 1:
The dimensions of the basic cantilever design. The gray zone is the piezoelectric layer. The zoomed...