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Search for "instrumentation design" in Full Text gives 2 result(s) in Beilstein Journal of Nanotechnology.

A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy

  • Hao Liu,
  • Zuned Ahmed,
  • Sasa Vranjkovic,
  • Manfred Parschau,
  • Andrada-Oana Mandru and
  • Hans J. Hug

Beilstein J. Nanotechnol. 2022, 13, 1120–1140, doi:10.3762/bjnano.13.95

Graphical Abstract
  • , but also perform rapid overview scans with the tip kept at larger tip–sample distances for robust imaging. Keywords: atomic force microscopy; atomic resolution; instrumentation design; multimodal operation; ultrahigh vacuum; Introduction Atomic force microscopy (AFM) operated under vacuum or
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Published 11 Oct 2022

Multimodal cantilevers with novel piezoelectric layer topology for sensitivity enhancement

  • Steven Ian Moore,
  • Michael G. Ruppert and
  • Yuen Kuan Yong

Beilstein J. Nanotechnol. 2017, 8, 358–371, doi:10.3762/bjnano.8.38

Graphical Abstract
  • to optimally actuate and sense M1–M4 respectively. Metal traces forming electrical connections run down the center of the cantilever. This splits some piezoelectric layers in two and these split layers are wire-bonded back together. Instrumentation of the cantilever Instrumentation design The
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Published 06 Feb 2017
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